The CS-8000 Series is designed for power electronics research, semiconductor development and device characterization where engineers need flexible voltage and current capabilities within a configurable test system.
The series consists of three mainframe configurations. The CS-8020 provides medium-voltage capability up to 200 V at 1 A or 100 V at 2 A. The CS-8200 adds a high-voltage unit supporting up to 2 kV at 20 mA, while the CS-8500 extends the high-voltage capability to 5 kV at 8 mA. Both the CS-8200 and CS-8500 support DC and pulse operation through their HV units.
All mainframes incorporate a medium-voltage unit and gate unit. The MV section supports voltage measurement ranges from 200 mV to 200 V, current ranges from 5 nA to 2 A, and DC, pulse, sine, half-wave and full-wave operation. The gate unit provides up to 40 V / 1 A, supports DC, pulse and 50 Hz sine waveforms, and enables programmable gate signal sequences for semiconductor characterization.
For high-current device testing, optional CS-205, CS-210 and CS-220 HC units extend peak pulse current capability to 500 A, 1,000 A and 2,000 A respectively, with a maximum HC voltage of 50 V. Pulse widths are configurable according to the selected unit and range, supporting testing of high-power devices while reducing thermal stress associated with continuous high-current operation.
The CS-8000 Series uses triaxial measurement connections and an optimized measurement architecture to reduce leakage and noise, enabling a minimum measured-current resolution of 250 fA. This makes the platform suitable not only for high-power characterization but also for very small leakage-current measurements.
A 12.1-inch touch display provides X-Y characteristic curves, time-domain Y-T waveform monitoring and detailed measurement data. Engineers can observe pulse width, measurement points and abnormal waveforms such as oscillation while testing. Measurement data, waveform information and setup conditions can also be saved to USB storage.
For wide-bandgap semiconductor evaluation, the CS-8000 Series provides a double-sweep function that simultaneously displays upward and downward sweeps for observing hysteresis in SiC and GaN devices. Programmable gate patterns and preliminary gate signals allow devices to be evaluated under multiple gate-bias conditions.
The system also supports on-wafer testing, temperature-characteristic measurement configurations, remote control through LAN, and fixture interlock functions for safer high-voltage and high-current measurements.
