Home ANRITSU | Mobile Wireless Communications Measuring Instruments Signalling Tester Base Station Simulator MD8430A
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ANRITSU | Mobile Wireless Communications Measuring Instruments

Signalling Tester Base Station Simulator MD8430A

The MD8430A Signalling Tester by Anritsu is a powerful LTE-Advanced Pro base station simulator developed for chipset and wireless device R&D. Supporting normal and fault operation tests, it provides an ideal protocol and performance testing environment for LTE, LTE-A, LTE-A Pro, Cat-M, and NB-IoT devices. With scalable architecture, customizable models, and carrier aggregation support up to 6CC, it enables comprehensive development, verification, and acceptance testing in lab settings..

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  • Special Features
  • Specification

Designed for the fast-evolving LTE-A Pro ecosystem, the MD8430A supports a wide frequency range from 350 MHz to 6 GHz, enabling test scenarios across various bands. Developers can simulate complex network environments including handover, multi-cell, and inter-RAT transitions while achieving high performance through 2x2, 4x2, 4x4, 8x2, and 8x4 MIMO support.

It offers precise modulation accuracy, flexible modulation schemes (QPSK to 256QAM), and a comprehensive access method simulation including OFDMA, SC-FDMA, CDMA, and TDMA.

With advanced capabilities such as Carrier Aggregation (up to 6 DL CCs) and support for both functional and protocol tests, the MD8430A enables chipset validation, early-stage device development, and carrier certification testing. The inclusion of baseband fading options, digital IQ interfaces, and multi-unit support allows users to construct tailored test environments matching complex real-world deployments.

Key applications include LTE-A Pro performance testing, NB-IoT validation, CA-MIMO integration testing, and transition/handover scenarios across heterogeneous networks.

  1. Complete LTE-A Pro Support: Handles LTE/LTE-A/LTE-A Pro standards including Cat-M and NB-IoT.

  2. Fault Operation Testing: Simulates fault conditions not possible on live networks.

  3. Customizable Test Models: Choose from BTM, MTM, and ETM based on development phase.

  4. High Throughput: Supports up to 1 Gbps DL / 300 Mbps UL (PHY layer up to 2 Gbps).

  5. Advanced MIMO & CA Testing: Up to 8x4 MIMO and 6 Component Carriers (DL), 3 CC (UL).

  6. Flexible Upgrades: Future-proof modular design with retrofittable upgrades and protocol extensions.

Parameter Details
Supported Technologies LTE, LTE-A, LTE-A Pro, Cat-M, NB-IoT, W-CDMA, GSM
Frequency Range LTE: 350 MHz – 6 GHz (with options)
Access Methods LTE: OFDMA/SC-FDMA, W-CDMA: CDMA, GSM: TDMA
Modulation LTE: QPSK to 256QAM, W-CDMA: QPSK/16QAM/64QAM, GSM: GMSK/8PSK
Max Data Rate DL: 1 Gbps (PHY 2 Gbps), UL: 300 Mbps
MIMO Configuration Up to 8x4 MIMO (with options)
Carrier Aggregation DL: Up to 6CC, UL: Up to 3CC
Active + Adjacent Base Stations 8 (max 6 active BTS)
Handover Support Available (including inter-frequency handover in CA)
Input Level Accuracy ±3.0 dB (Main/Sub connectors)
Output Level Accuracy ±1.5 dB to ±2.0 dB depending on frequency
Frequency Resolution 100 kHz
Modulation Accuracy LTE: ≤2%, W-CDMA: ≤3.5%, GSM: ≤1.5 deg / ≤3.5% (8PSK)
Synchronization Acquisition Range LTE: ±100 μs (PRACH), ±30 μs (PUSCH); W-CDMA & GSM: ±100 chips/symbols
Connectors Main/Sub RF connectors
Upgrade Options Carrier aggregation, MIMO, fading, dual tester configurations