Home PMK | High Voltage Differential Probes Test Point to 4mm Adapters for BumbleBee® and HORNET® Series
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PMK | High Voltage Differential Probes

Test Point to 4mm Adapters for BumbleBee® and HORNET® Series

Now includes NABL Calibration Certificate.

PMK’s 4mm test point adapters enable direct, high-integrity connections between BumbleBee® or HORNET® high-voltage differential probes and common test points such as MMCX, SMA, BNC, and square pins — while preserving the full probe bandwidth performance..

  • Detail
  • Special Features
  • Specification

The Test Point to 4mm Adapter Series is built to meet the demanding needs of high-voltage, high-frequency probing in power electronics applications. These adapters enable secure and low-loss connections between PMK’s high-performance differential probes (BumbleBee® or HORNET®) and test points using industry-standard connectors such as MMCX, SMA, BNC, or square pins.

Engineered to preserve the entire bandwidth performance of the probes, these adapters are optimized for accurate measurements in high-speed switching environments such as GaN/SiC device evaluation, double-pulse testing, and HV system analysis.

Note: These adapters are not intended for handheld use and should be integrated into bench-top or automated setups for safe and stable measurements.

  • Compatible with BumbleBee® and HORNET® series probes

  • Maintains full specified probe bandwidth

  • Supports reliable connection to:

    • MMCX

    • SMA

    • BNC

    • Square pin headers

  • Designed for power electronics probing tasks

  • Rigid, non-handheld construction for safe and accurate measurements

  • Compatibility: PMK BumbleBee® & HORNET® high-voltage differential probes

  • Adapter Types:

    • MMCX

    • SMA

    • BNC

    • Square pin headers

  • Bandwidth: Fully maintained as per probe’s original specification

  • Use Cases:

    • GaN/SiC power device testing

    • Switching power supply measurements

    • Double-pulse test setups

    • Automated or benchtop high-voltage probing

  • Form Factor: Non-handheld, test station compatible