Home Iwatsu | Curve Tracers CS-8500 Curve Tracer

The IWATSU CS-8500 Semiconductor Curve Tracer is the 5 kV high-voltage mainframe in the CS-8000 Series, developed for precise static characterization of high-voltage power semiconductor devices. Its integrated HV unit delivers a maximum peak output of 5,000 V at 8 mA with 40 W peak power, while the built-in medium-voltage section supports 200 V / 1 A or 100 V / 2 A operation. With 250 fA minimum current measurement resolution, programmable gate control, DC and pulse high-voltage operation, and a 12.1-inch touch display, the CS-8500 is suited to advanced characterization of SiC, GaN and other power semiconductor devices..

  • Detail
  • Special Features
  • Specification

The IWATSU CS-8500 is the highest-voltage mainframe in the CS-8000 Series. It combines a dedicated high-voltage unit with the series' medium-voltage and gate units, providing a flexible platform for evaluating semiconductor characteristics across high-voltage, low-current and medium-voltage operating regions.

 

The integrated HV unit provides up to 5 kV at 8 mA, corresponding to a maximum peak power of 40 W. Available HV voltage ranges extend from 200 V to 5 kV, and the system supports both DC and pulse operation with positive or negative polarity. Constant-voltage and constant-current drive measurements are supported for flexible device characterization.

 

For measurement, the HV section provides voltage ranges from 50 V to 5 kV. The CS-8500 can measure HV current up to 10 mA, while dedicated LEAKAGE operation provides current ranges down to 5 nA. The system architecture achieves a minimum current measurement resolution of 250 fA, supporting accurate low-current and leakage characterization alongside high-voltage testing.

 

The integrated medium-voltage unit provides a maximum peak power of 200 W, supporting output combinations of 200 V / 1 A and 100 V / 2 A. Current measurement ranges extend from 5 nA to 2 A, and supported operating modes include DC, pulse, long pulse, sine and rectified-sine waveforms.

 

The built-in GATE unit delivers up to 40 V / 1 A and provides voltage measurement ranges from 1 V to 50 V and current measurement ranges from 5 nA to 1 A. Programmable gate sequencing includes a -40 V to +40 V pre-signal range and configurable hold-time stages from 0 to 5 seconds, enabling semiconductor devices to be tested under different gate-bias conditions.

 

The CS-8500 supports single, repeat and stop measurement modes, together with one-point, single-sweep and double-sweep operation. Up to 1,000 sweep steps can be configured. The double-sweep function is particularly useful for examining hysteresis characteristics in wide-bandgap semiconductor devices such as SiC and GaN.

 

A 12.1-inch TFT-LCD touch panel with 1280 × 800 WXGA resolution provides X-Y characteristic curves, Y-T waveform monitoring, measurement data and cursor information. Waveform, measurement and setup data can be stored internally or on USB memory, while 10/100/1000BASE-T LAN connectivity supports remote control and automated test environments.

 

For applications requiring high-current characterization, the CS-8500 can be combined with optional CS-205, CS-210 or CS-220 high-current units, extending pulse-current capability to 500 A, 1,000 A or 2,000 A respectively at up to 50 V. These high-current units are optional and are not included with the basic CS-8500 mainframe.

 

According to PMK America, the CS-8500 requires the CC-8500 Calibration Certificate, ID-8500 Inspection Test Data, CS-021 HV standard connection cable set and CS-322 test fixture. The CS-520 patch panel, CS-5xx test adapters and CS-2xx current-extension units are not included with the listed mainframe configuration.

  • 5,000 V maximum peak HV output for high-voltage semiconductor characterization.
  • Maximum HV source current of 8 mA at 5 kV.
  • 40 W maximum HV peak power.
  • HV voltage ranges extending from 200 V to 5 kV.
  • HV measurement-voltage ranges from 50 V to 5 kV.
  • HV current measurement capability up to 10 mA on the CS-8500.
  • Dedicated leakage measurement ranges extending down to 5 nA.
  • 250 fA minimum current measurement resolution.
  • Supports DC and pulse HV operation.
  • Positive and negative high-voltage polarity.
  • Constant-voltage and constant-current drive measurement.
  • Integrated MV unit with 200 V / 1 A or 100 V / 2 A capability.
  • 200 W maximum MV peak power.
  • MV measured-current range from 5 nA to 2 A.
  • Integrated 40 V / 1 A gate unit.
  • Programmable gate sequencing for advanced device characterization.
  • Gate pre-signal voltage from -40 V to +40 V.
  • Gate hold time configurable from 0 to 5 seconds.
  • Single and double sweep functions with up to 1,000 steps.
  • Suitable for hysteresis characterization of SiC and GaN devices.
  • 12.1-inch TFT-LCD touch screen.
  • 1280 × 800 WXGA resolution.
  • X-Y, Y-T, data-list and cursor display functions.
  • Internal and USB storage for measurement data, setup information and screen captures.
  • 10/100/1000BASE-T LAN remote-control interface.
  • Optional high-current expansion up to 2,000 A.
  • Supports connection to compatible wafer probers for on-wafer measurements.
  • Interlock and configurable voltage, current and power limits support safer semiconductor testing.

 

Product Type Semiconductor Curve Tracer Mainframe
Series CS-8000 Series
Model CS-8500
HV Unit Integrated
Maximum HV Peak Voltage 5,000 V
Maximum HV Peak Current 8 mA at 5 kV
Maximum HV Peak Power 40 W
HV Output Voltage Ranges 200 V, 500 V, 1 kV, 2 kV, 5 kV
HV Measured Voltage Range 50 V to 5 kV
Maximum HV Measured Current Up to 10 mA
HV Leakage Current Range Down to 5 nA
Minimum Current Resolution 250 fA
HV Modes DC, Pulse
HV Polarity Positive, Negative
HV Drive Modes Constant Voltage, Constant Current
HV Pulse Width 20 ms to 1.6 s
HV Pulse Duty Ratio ≤50% to 80%, depending on conditions
MV Maximum Peak Power 200 W
MV Maximum Output 200 V / 1 A or 100 V / 2 A
MV Measured Voltage Range 200 mV to 200 V
MV Measured Current Range 5 nA to 2 A
MV Modes DC, Pulse, Long Pulse, Sine, Rectified Sine
MV Normal Pulse Width 50 μs to 10 ms
MV Long Pulse Width 50 μs to 1.6 s
Gate Maximum Output 40 V / 1 A
Gate Maximum Peak Power 40 W
Gate Measured Voltage Range 1 V to 50 V
Gate Measured Current Range 5 nA to 1 A
Gate Pre-Signal Range -40 V to +40 V
Gate Hold Time 0 to 5 s
Measurement Cycle 2 ms to 5 s
Measurement Modes Single, Repeat, Stop
Sweep Methods 1-Point, Single, Double
Sweep Steps 1 to 1,000
Display 12.1-inch TFT-LCD Touch Panel
Display Resolution 1280 × 800 WXGA
Screen Modes XY, YT, Data List, Cursor
User Interface Front Panel, Touch Panel, Mouse, Keyboard
LAN Interface 10/100/1000BASE-T
External Storage USB, FAT/FAT32/exFAT
Stored Data Measurement Data, Setup, Screen Copy
Interlock Supported
Power Supply AC 100 V to 240 V ±10%, 50/60 Hz
Maximum Power Consumption 220 VA
Dimensions 424 W × 221 H × 556 D mm
Weight Approx. 21 kg, excluding accessories/options
Performance Temperature Range +10°C to +35°C
Operating Temperature Range 0°C to +40°C
Warm-Up Time 30 minutes

The HV ratings, measurement ranges and operating modes are based on the current CS-8000 Series instruction manual. The display, interface, physical and power specifications are common to the CS-8200/CS-8500 mainframes where indicated by IWATSU.

Compatible High-Current Units

Model Maximum Peak Current Maximum Voltage Operation
CS-205 500 A 50 V Pulse
CS-210 1,000 A 50 V Pulse
CS-220 2,000 A 50 V Pulse

The optional HC architecture allows the CS-8000 platform to extend from high-voltage characterization into high-current pulse testing. Pulse width is configurable from 10 μs to 1 ms on appropriate ranges, while the 1,000 A and 2,000 A ranges support up to 500 μs.

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